Webinar Programs

Pitfalls in Optical Testing: Commonly Made Mistakes and What to Watch Out For

Scientists and engineers who perform routine measurements of optical system performance, often make incorrect assumptions in the design of the setup that lead to erroneous results. These are common pitfalls that we have all may have made at one time or another or passed on to the next generation of optical technicians, scientists, and engineers. This webinar will cover some common mistakes and pitfalls that optics professionals have encountered and will discuss some appropriate solutions and methods. Participants will be able to guide the discussion by selecting from the following topics:

 

  • Thermal source calibration
  • Infinite vs. finite conjugate testing
  • Optical transmission measurements
  • Measuring Strehl intensity
  • Concatenating MTFs
  • Validating and calibrating test equipment
  • Managing unreal expectations for testing
  • Collimators, fold mirrors, and chromatic aberration considerations
  • Correlating and comparing MTF measurements with interferometric measurements
 
Speakers:
  • Stephen D. Fantone, President
  • David Imrie, Chief Technical Officer
  • Roy Youman, Optical and E-O Test Systems Product Manager
  • David Biss, Principal Optical Engineer
 
 
Who Should Attend
  • Engineers, Senior Engineers
  • Technicians
  • Lens designers, manufacturers, QC departments that want to test their designs, assemblies, and/or manufacturing process
  • Professionals and students looking for an overview of optical metrology techniques
 
Level
  • Appropriate for all levels.
 

 

Seminar Objectives
  • Hard learned lessons based on other people’s mistakes that they have made over and over again.
Seminar Information
Date Presented:
May 22, 2013 1:00 PM Eastern
Length:
1 hour
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Pitfalls in Optical Testing: Commonly Made Mistakes and What to Watch Out For

 

Stephen Fantone is the founder and president of Optikos Corporation, currently celebrating its 30th year. He has Bachelor degrees in Electrical Engineering and Management from MIT, and a PhD from the Institute of Optics at the University of Rochester. He has been awarded more than 60 U.S. patents and in 2008, Optikos was the recipient of the Massachusetts Small Business Administration’s Exporter of the Year Award. Since 1996, he has served as a director and Treasurer of the Optical Society of America. Stephen is also a Senior Lecturer in the Mechanical Engineering Department at MIT.




Dr. David Imrie received his PhD in Physics from the University of Natal, South Africa, in 1993. He then spent five years working in the optics section of the National Physics Laboratory at the CSIR in Pretoria. During this time, he worked on a number of projects in both the military and commercial sectors. He joined Optikos in 1998 as a Senior Optical Engineer. Aside from his present responsibility for the engineering services’ side of Optikos business, he regularly exercises his diverse interests by making optical, electronic, and software engineering contributions to many projects. Dr. Imrie is an expert at optical design, optical engineering, and metrology systems.



Dr. David P. Biss received his Ph.D. in Optics from the Institute of Optics at the University of Rochester in 2005. His thesis work involved the study of in-homogeneously polarized beams in microscopy systems. Prior to joining Optikos David held multiple positions at different organizations developing retinal imaging instruments for disease study, polarimetric and hyperspectral imaging system design, and building adaptive optics systems for human retinal imaging. David is a Principal Optical Engineer at Optikos where he is actively involved in supporting Optikos's Engineering Services division.




Roy Youman runs the Optical Metrology Services (OMS) group at Optikos and has been intimately involved with the design, production, and installation of the full line of optical metrology instruments produced by Optikos. Roy Youman received an undergraduate degree in optical engineering at the Institute of Optics at the University of Rochester. After gaining experience in interferometery at Space Optics Research Labs, he attended the graduate program at Tufts University. While at Tufts, he began working part-time performing lens measurements at Optikos Corporation. After finishing his masters in electro-optics at Tufts, he joined Optikos full-time in 1993. Over the past 20 years, Roy has gained extensive optical metrology experience through the wide range of lenses that are tested in the Optikos OMS service. He has provided valuable guidance in the evolution of the Optikos line of MTF measuring instruments and has traveled extensively to install Optikos systems and train his customers. He continues to provide support for the Optikos existing customer base and is actively involved with the sales and marketing of the instruments and services provided by Optikos.

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